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Statistical Analysis Spatial Pattern by Bartlett (19 results)
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The Statistical Analysis of Spatial Pattern
Published by Chapman and Hall LTD., 1975
ISBN 10: 0412142902 ISBN 13: 9780412142901
Language: English
Seller: BoundlessBookstore, Wallingford, United Kingdom
Seller rating 5 out of 5 stars
US$ 4.17
Convert currencyUS$ 9.43 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. Light wear to boards. Content is clean and bright. Good DJ. Small name to endpaper.
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The Statistical Analysis of Spatial Pattern
Published by Wiley & Sons, Incorporated, John, 1976
ISBN 10: 0470054670 ISBN 13: 9780470054673
Language: English
Condition: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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The statistical analysis of spatial pattern M.S. Bartlett. Monographs on statistics and applied probability; Halsted Press Book.
Published by London, Chapman and Hall, 1975
ISBN 10: 0470054670 ISBN 13: 9780470054673
Language: English
US$ 16.06
Convert currencyUS$ 18.75 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketHardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ancien Exemplaire de bibliothèque avec signature et cachet. BON état, quelques traces d'usure. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. 62 BAR 9780470054673 Sprache: Englisch Gewicht in Gramm: 250.
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Statistical Analysis of Spatial Pattern, The (Monographs on Applied Prabability and Statistics)
Published by Chapman & Hall LTD., London, 1975
ISBN 10: 0412142902 ISBN 13: 9780412142901
Language: English
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
Seller rating 5 out of 5 stars
First Edition
US$ 22.14
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Add to basketHardcover. Condition: Good. Dust Jacket Condition: No Dust Jacket. First Edition. Green cover with silver gilt lettering to spine has 4 cm tear along the edge of spine. Contents in very good clean condition. Library plate on front inside cover. Library stamp on prelims, some pages (with no obstruction of text), back inside cover and top of page block. Illustrated with diagrams and tables. Ex-Library.
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Condition: New. SUPER FAST SHIPPING.
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US$ 59.16
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Add to basketCondition: New.
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Condition: New.
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The Statistical Analysis of Spatial Pattern (Ettore Majorana International Science Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 66.58
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Add to basketCondition: New. In.
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The Statistical Analysis of Spatial Pattern
Published by John Wiley & Sons Inc, 1976
ISBN 10: 0470054670 ISBN 13: 9780470054673
Language: English
US$ 12.06
Convert currencyUS$ 72.05 shipping from Germany to U.S.A.Quantity: 1 available
Add to baskethardcover. Condition: Befriedigend. Seiten; 9780470054673.4 Gewicht in Gramm: 1.
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US$ 65.79
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Add to basketPaperback. Condition: New.
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Condition: New. pp. 106.
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The Statistical Analysis of Spatial Pattern. Monographs on Applied Probability and Statistics.
Published by London: Chapman and Hall, 1975., 1975
Seller: Librería Antonio Castro, SEVILLA, SE, Spain
Association Member: AILA ILAB SEVILLA
Seller rating 5 out of 5 stars
US$ 17.37
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Add to basketPrimera edición. 4to. 90pp. Encuadernación en tela editorial con sobrecubierta. Excelente estado. First edition. In original cloth with dustjacket. Excellent copy.
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The Statistical Analysis of Spatial Pattern
Published by Chapman and Hall Ltd, 1974
ISBN 10: 0412142902 ISBN 13: 9780412142901
Language: English
First Edition
US$ 72.40
Convert currencyUS$ 52.72 shipping from France to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Very Good. Dust Jacket Condition: Very Good. 1st Edition. Monographs on applied probability and statistics.
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The Statistical Analysis of Spatial Pattern
Published by Springer Netherlands, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Language: English
US$ 70.46
Convert currencyUS$ 71.14 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.
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US$ 86.32
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Add to basketCondition: New. Print on Demand pp. 106 22:B&W 5.5 x 8.5 in or 216 x 140 mm (Demy 8vo) Perfect Bound on White w/Gloss Lam.
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US$ 95.14
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Add to basketCondition: New. PRINT ON DEMAND pp. 106.
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The Statistical Analysis of Spatial Pattern
Published by Springer Netherlands, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Language: English
US$ 58.37
Convert currencyUS$ 57.40 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribu.
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The Statistical Analysis of Spatial Pattern
Published by Springer Netherlands Nov 2013, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 103.24
Convert currencyUS$ 26.95 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes. 104 pp. Englisch.
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The Statistical Analysis of Spatial Pattern
Published by Springer Netherlands, Springer Netherlands Nov 2013, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
US$ 64.54
Convert currencyUS$ 70.29 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 104 pp. Englisch.
