Order Total (1 Item Items):
Shipping Destination:
Testing Small Delay Defects Nanoscale (30 results)
Feedback
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (30)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (26)
- As New, Fine or Near Fine (4)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (12)
- Not Print on Demand (27)
Language (1)
Price
- Any Price
- Under US$ 25 (No further results match this refinement)
- US$ 25 to US$ 50 (No further results match this refinement)
- Over US$ 50
Free Shipping
Seller Location
Seller Rating
-
Condition: New.
-
Condition: New. SUPER FAST SHIPPING.
-
US$ 122.14
Convert currencyUS$ 8.76 shipping from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 259.
-
Condition: New.
-
Condition: New. pp. 259.
-
Condition: As New. Unread book in perfect condition.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Ltd, 2017
ISBN 10: 1138075779 ISBN 13: 9781138075771
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 132.39
Convert currencyUS$ 16.36 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days. 539.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.81
Convert currencyUS$ 16.15 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 132.38
Convert currencyUS$ 20.22 shipping from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: New.
-
US$ 147.30
Convert currencyUS$ 11.67 shipping from Germany to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 259.
-
Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 148.70
Convert currencyUS$ 20.22 shipping from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
Condition: New. pp. 250 2nd Edition.
-
Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
-
US$ 224.48
Convert currencyFree shipping from Australia to U.S.A.Quantity: 1 available
Add to basketBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
US$ 224.48
Convert currencyFree shipping from Australia to U.S.A.Quantity: 1 available
Add to basketBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
US$ 220.30
Convert currencyUS$ 11.67 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 250.
-
Condition: New.
-
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor and Francis Inc, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 283.75
Convert currencyUS$ 6.77 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Condition: As New. Unread book in perfect condition.
-
Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 283.73
Convert currencyUS$ 20.22 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New.
-
Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 290.82
Convert currencyUS$ 20.22 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: As New. Unread book in perfect condition.
-
US$ 298.02
Convert currencyUS$ 57.48 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: New. Sandeep Kumar Goel is a Senior Manager (DFT/3D-Test) with Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA. He received his Ph.D. degree from the University of Twente, The Netherlands. Prior to TSMC, he was in various rese.
-
US$ 334.98
Convert currencyUS$ 33.70 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Brand New. 1st edition. 250 pages. 9.49x6.10x0.87 inches. In Stock.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Inc Okt 2013, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
US$ 363.94
Convert currencyUS$ 73.91 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketBuch. Condition: Neu. Neuware - Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DiM)-related rule violations. The book also addresses small-delay defects (SDDs) and testing, which can cause immediate failures if introduced on both critical and non-critical paths in the circuit.
-
US$ 133.34
Convert currencyUS$ 57.48 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sandeep Kumar Goel is a Senior Manager (DFT/3D-Test) with Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA. He received his Ph.D. degree from the University of Twente, The Netherlands. Prior to TSMC, he was in various rese.
-
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
US$ 201.07
Convert currencyUS$ 8.76 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 250 This item is printed on demand.
-
US$ 152.30
Convert currencyUS$ 72.78 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
