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Trace Based Post Silicon Validation Vlsi by Liu Xiao (18 results)
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
paperback. Condition: New. Well packaged and promptly shipped from California. US veteran operated.
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
US$ 116.06
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
US$ 116.06
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.43
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 135.24
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Condition: New. pp. 126.
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Condition: New. pp. 123.
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Trace-Based Post-Silicon Validation for VLSI Circuits
Published by Springer, Berlin, Springer International Publishing, Springer, 2016
ISBN 10: 3319375946 ISBN 13: 9783319375946
Language: English
US$ 131.86
Convert currencyUS$ 33.77 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
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US$ 174.45
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Add to basketPaperback. Condition: Brand New. reprint edition. 124 pages. 9.25x6.10x0.30 inches. In Stock.
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US$ 176.20
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Add to basketHardcover. Condition: Brand New. 2013 edition. 136 pages. 9.25x6.25x0.50 inches. In Stock.
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
US$ 189.79
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Add to basketPaperback. Condition: Like New. Like New. book.
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Trace-Based Post-Silicon Validation for VLSI Circuits
Published by Berlin Springer International Publishing Springer Aug 2016, 2016
ISBN 10: 3319375946 ISBN 13: 9783319375946
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 128.32
Convert currencyUS$ 26.78 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. 108 pp. Englisch.
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US$ 153.24
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Add to basketCondition: New. Print on Demand pp. 123.
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US$ 156.02
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Add to basketCondition: New. Print on Demand pp. 126 59 Illus. (38 Col.).
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Trace-Based Post-Silicon Validation for VLSI Circuits
Published by Springer International Publishing, 2013
ISBN 10: 3319005324 ISBN 13: 9783319005324
Language: English
US$ 110.67
Convert currencyUS$ 57.05 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive summary of state-of-the-art on post-silicon validationOffers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transferIllustrate key c.
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Trace-Based Post-Silicon Validation for VLSI Circuits
Published by Springer International Publishing, 2016
ISBN 10: 3319375946 ISBN 13: 9783319375946
Language: English
US$ 111.54
Convert currencyUS$ 57.05 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive summary of state-of-the-art on post-silicon validationOffers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transferIllustrate key c.
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US$ 169.02
Convert currencyUS$ 11.59 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 123.
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US$ 169.58
Convert currencyUS$ 11.59 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 126.
