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X Ray Diffraction Basics Nanostructure by Chen Associate (1 results)
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X-Ray Diffraction: From Basics to Nanostructure Determination (Chinese Edition)
Published by Createspace Independent Publishing Platform, 2017
ISBN 10: 197579561X ISBN 13: 9781975795610
Language: Chinese
US$ 10.90
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
