Advances in Optical and Electron Microscopy, Volume 12.

Mulvey, Tom / J.R. Sheppard (Ed.) -

ISBN 10: 0120299127 / ISBN 13: 9780120299126

Published by London/New York, Academic Press, 1991

About this Item

Formateinband: Pappband / gebundene Ausgabe XII, 363 S. (24 cm) 1st Edition; (With many figures); Sauberes Exemplar aus Institutsbibliothek mit den üblichen Schildchen und Stempeln; sonst tadellos. Sprache: Englisch Gewicht in Gramm: 800 [Stichwörter: Invention of the Electron Fresnel Interference Biprism, Electron Image Plane Off-axis Holography of Atomic Structures, Magnetic Through-the-lens detection in electron microscopy and spectroscopy, Advances in voltage-contrast detectors in scanning electron microscopes, Scanning Near-field optical microscopy (SNOM), Microscopic thermal wave non-destructive testing].

Seller Inventory # 10239

Bibliographic Details

• Title: Advances in Optical and Electron Microscopy, Volume 12.
• Publisher: London/New York, Academic Press
• Publication Date: 1991
• Language: English
• ISBN 10: 0120299127
• ISBN 13: 9780120299126
• Binding: Hardcover
• Edition: 1st Edition
• Condition: Gut
• Weight: 800 grams
• Seller catalogs:
  • Physik

About this title

Synopsis

The volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and industrial inspection.