AutoTestCon '82 - IEEE Internationational Automatic Testing Conference, 12-14 October 1982, Dayton, Ohio

IEEE Internationational Automatic Testing Conference; et.al.

Published by IEEE; The Institute of Electrical and Electronics Engineers, Inc., New York, NY, U.S.A., 1982
Used Condition: Very Good Hardcover

From SUNSET BOOKS 2, Newark, OH, U.S.A.

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