Characterization of Defects in Materials: Volume 82, Materials Research Society Symposia Proceedings; 1-2 December, 1986; Boston, Massachusetts.

Siegel, Richard W. (Editor); Weertman, Julia R. (Editor); Sinclair, Robert (Editor)Hautojarvi, P.; Schaffer, James P.; Jones, P. L.; et.al.

ISBN 10: 0931837472 ISBN 13: 9780931837470
Published by Materials Research Society, Pittsburg, PA, U.S.A., 1987
Language: English
Condition: Used - Very good Hardcover

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