Defect and Fault Tolerance in VLSI Systems 1992 IEEE International Workshop Proceedings

Institute of Electrical and Electronics Engineers

ISBN 10: 0818628359 / ISBN 13: 9780818628351

Published by IEEE Computer Society Press, Los Alamos, NM, 1993

About this Item

Black lettering on yellow covers. 8vo, 334pp.

Seller Inventory # 011781

Bibliographic Details

• Title: Defect and Fault Tolerance in VLSI Systems 1992 IEEE International Workshop Proceedings
• Publisher: IEEE Computer Society Press, Los Alamos, NM
• Publication Date: 1993
• Language: English
• ISBN 10: 0818628359
• ISBN 13: 9780818628351
• Binding: Hardcover
• Edition: 1st Edition
• Condition: New
• Dust Jacket Condition: No Jacket

About this title

Synopsis

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect and fault modeling, defect tolerance, fault tolerant arithmetics, system testing, and routing for defect tolerance. In addition, invited speakers discuss the WASP project, and the lessons from designing a wafer scale 2D array. No subject index. Annotation copyright Book News, Inc. Portland, Or.