Defect and Fault Tolerance in VLSI Systems Volume 2.

Editors C.H. Stapper, V.K. Jain and G. Saucier

ISBN 10: 0306435314 / ISBN 13: 9780306435317

Published by Plenum Press, New York, 1990

About this Item

VG, hardback, maroon glazed board covers with white titles on spine turning purple, contents are clean and unmarked,large octavo 316pp. Ex-Admiralty Underwater Weapons Library. weight 750g.

Seller Inventory # 000309

Bibliographic Details

• Title: Defect and Fault Tolerance in VLSI Systems Volume 2.
• Publisher: Plenum Press, New York
• Publication Date: 1990
• Language: English
• ISBN 10: 0306435314
• ISBN 13: 9780306435317
• Binding: Hard Cover
• Edition: First Edition
• Condition: Very Good
• Dust Jacket Condition: No Jacket
• Book Type: Ex-Library
• Seller catalogs:
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About this title

Synopsis

Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con­ tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.