Digital Systems Testing and Testable Design
Language: English
Published by John Wiley and Sons Inc, US, 1994
- First Edition
- Hardcover
- New

Seller: Rarewaves.com USA, London, London, United KingdomRarewaves.com USA
AbeBooks seller since June 11, 2025
Condition: New
US$ 271.48
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Add to basketItem description from seller
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Seller Inventory # LU-9780780310629
- Title
- Digital Systems Testing and Testable Design
- Author
- Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
- Publisher
- John Wiley and Sons Inc, US
- Publication year
- 1994
- Condition
- New
- Binding
- Hardback
- Language
- English
- ISBN 10
- 0780310624
- ISBN 13
- 9780780310629
- Edition
- 1st.
- Item weight
- 1,361 grams
- Dimensions
- 18.55 x 4.16 x 25.75 cm
"Synopsis" may belong to another edition of this title.
About the Author
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
"About the title" may belong to another edition of this title.
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