High-Resolution Electron Microscopy for Materials Science. This item is unavailable.
Language: English
Published by Springer Japan, 1998
- First Edition
- Softcover
- Used
Seller: Better World Books, Mishawaka, IN, U.S.A.Better World Books
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Softcover
Condition: Used - Good
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Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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- Title
- High-Resolution Electron Microscopy for Materials Science
- Author
- Shindo, Daisuke; Kenji, Hiraga
- Publisher
- Springer Japan
- Publication year
- 1998
- Condition
- Good
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 4431702342
- ISBN 13
- 9784431702344
- Edition
- 1st Edition.
- Item weight
- 1.367 pounds
- Dimensions
- N/A
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
"Synopsis" may belong to another edition of this title.
Language Notes
Text: English (translation)
Original Language: Japanese
Original Language: Japanese
"About the title" may belong to another edition of this title.
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