ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has or May Have all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1993 for this Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. This volume was purchased through Local Public Auction. All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. Size: 4to.

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Bibliographic Details

Title

Integrated Circuit Metrology, Inspection, and Process Control VII: Proceedings of SPIE, Volume 1926, 2-4 March 1993, San Jose, California

Publisher

SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A.

Publication Date

1993

Language

English

ISBN 10

0819411604

ISBN 13

9780819411600

Binding

Paperback

Edition

1st.

Condition

Very Good

Dust Jacket Condition

No Jacket

Book Type

Ex-Library

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SUNSET BOOKS 2
OH, U.S.A.

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