W/full markings and pocket. Wear, Soil. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Ex-Library Size: 4to.

Seller Inventory # 019301

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Bibliographic Details

Title

Integrated Circuit Metrology, Inspection, and Process Control, Proceedings of: Volume 775, 4-6 March 1987, Santa Clara, California, SPIE.

Publisher

The International Society for Optical Engineering, Bellingham, WA, U.S.A.

Publication Date

1987

Language

English

ISBN 10

0892528109

ISBN 13

9780892528103

Binding

Paperback

Edition

1st.

Condition

Very Good

Dust Jacket Condition

No Jacket

Book Type

Ex-Library

Seller catalogs

OPTICS/OPTICAL

Store Description

Thank You for looking at our books! We invite you to browse our bookstore for the many rare and antique volumes we have listed. Our listed books range the entire spectrum, with Mathematics, Physics, Nuclear Physics, Chemistry, Biochemistry, Aviation, Natural resources, Medicine,Electricity, Electronics, Philosophy, History, Genealogy, childrens books, Textbooks, Journals, and many more. Many of our rare/out-of-print volumes came from the U.S. Air Force Technical Library and are very unique. We strive to provide books to individuals around the world at competitive prices. Customers should know that 10-20% of their total order to include shipping cost goes to ABEbooks in fees and charges, especially on lower price volumes.

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SUNSET BOOKS 2
OH, U.S.A.

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Terms of Sale

We guarantee the condition of every book as it's described on the Abebooks web sites. If you're dissatisfied with your purchase (Incorrect Book/Not as Described/Damaged) or if the order hasn't arrived, you're eligible for a refund within 30 days of the estimated delivery date. If you've changed your mind about a book that you've ordered, please use the Ask bookseller a question link to contact us and we'll respond within 2 business days.

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First item	US$ 5.50	US$ 10.90

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