412 pp. Tightly bound. Corners not bumped. Text is free of markings. No ownership markings. No dust jacket. Please Note: The reason for the lower "good" rating is because there is foxing to the top and side fore-edges. First Edition / First Printing. 1,3,5,7,9,8,6,4,2. This copy is smyth sewn. Smyth sewing is a method of bookbinding where groups of folded pages (referred to as signatures) are stitched together using binder thread. Each folded signature is sewn together individually with multiple stitches and then joined with other signatures to create the complete book block. This is the traditional and best method of bookbinding.

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Bibliographic Details

Title: Introduction to Scanning Tunneling Microscopy
Publisher: Oxford University Press, New York, NY
Publication Date: 1993
Language: English
ISBN 10: 0195071506
ISBN 13: 9780195071504
Binding: Hardcover
Edition: 1st Edition
Condition: Good
Dust Jacket Condition: No Dust Jacket

About this title

Synopsis

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

About the Author

C. Julian Chen is at IBM Thomas J. Watson Research Center.

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