On Line-testing for VLSI
. Ed(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K.
ISBN 10: 1441950338 ISBN 13: 9781441950338
Published by Springer-Verlag New York Inc., 2010
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Soft cover
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Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 8. Weight in Grams: 385. . 2010. 1st ed. Softcover of orig. ed. 1998. Paperback. . . . . Seller Inventory # V9781441950338
Synopsis:
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
"About this title" may belong to another edition of this title.
Bibliographic Details
Title: On Line-testing for VLSI
Publisher: Springer-Verlag New York Inc.
Publication Date: 2010
Binding: Soft cover
Condition: New
Edition: 1st Edition
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On-Line Testing for VLSI (Paperback)
Published by
Springer-Verlag New York Inc., New York, NY, 2010
ISBN 10: 1441950338
ISBN 13: 9781441950338
New
Paperback
First Edition
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781441950338
Quantity: 1 available
Stock Image
On-Line Testing for VLSI (Paperback)
Published by
Springer-Verlag New York Inc., New York, NY, 2010
ISBN 10: 1441950338
ISBN 13: 9781441950338
New
Paperback
First Edition
Seller: AussieBookSeller, Truganina, VIC, Australia
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Seller Inventory # 9781441950338
Quantity: 1 available