Near-Field Optics : Theory, Instrumentation, and Applications
Language: English
Published by Wiley & Sons, Incorporated, John, 1996
- First Edition
- Hardcover
- Used

Seller: Better World Books, Mishawaka, IN, U.S.A.Better World Books
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Condition: Used - Good
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Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Seller Inventory # 16352737-6
- Title
- Near-Field Optics : Theory, Instrumentation, and Applications
- Author
- Paesler, Michael A., Moyer, Patrick J.
- Publisher
- Wiley & Sons, Incorporated, John
- Publication year
- 1996
- Condition
- Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0471043117
- ISBN 13
- 9780471043119
- Edition
- 1st Edition.
- Item weight
- 1.629 pounds
- Dimensions
- N/A
Near-field microscopes combine the richness of optical analysis, the noninvasive character of light, and the wide variety of sample environments of conventional microscopes with the finer spatial resolution of alternative technologies. Near-Field Optics combines an introduction to near-field optical theory with a handbook and reference for the practice and application of near-field microscopy. Michael A. Paesler and Patrick J. Moyer provide the most comprehensive presentation available on the instrumentation and operation of near-field microscopes. Writing from the viewpoint of the scientist who wants to apply these revolutionary instruments in a laboratory setting, the authors:
* Explain the pertinent optical theory and provide a developmental history of near-field instruments
* Discuss imaging theory and its application in the near-field scanning optical microscope (NSOM)
* Explore the optical behavior of elements that provide the near-field/far-field connection in an NSOM
* Provide operational how-to's for NSOMs
* Examine the theory and operation of optical tunneling microscopes with special emphasis on the photon tunneling microscope (PTM)
* Enumerate contrast mechanisms available to the near-field microscopist
* Describe the application of near-field techniques in biology, materials science, surface chemistry, and information storage
"Synopsis" may belong to another edition of this title.
About the Author
PATRICK J. MOYER is Professor of Physics at the University of North Carolina at Charlotte. A former researcher with TopoMetrix of Santa Clara, California, he was the chief scientist responsible for the design and development of the first commercially available near-field scanning optical microscope.
"About the title" may belong to another edition of this title.
Better World Books
Mishawaka, IN, U.S.A.
AbeBooks seller since August 3, 2006
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