Physical Aspects of Electron Microscopy and Microbeam Analysis. This item is unavailable.
Language: English
Published by John Wiley & Sons Ltd, U.S.A., 1975
- First Edition
- Hardcover
- Used
Seller: Charles Berry, Bookseller, Lakeport, CA, U.S.A.Charles Berry, Bookseller
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AbeBooks seller since March 5, 2026
Unavailable
Hardcover
Condition: Used - Very good
US$ 18.00
Item description from seller
Large hardcover in excellent condition: slight handling, owner bookplate on the front endpaper, slight cloth indentation otherwise unmarked. The dust jacket is good with small corner tears, slight spine fading, small green indentation, and is protected by a new, clear, removeable cover. 474 pages, with advanced information throughout. [3.2 lbs].
Seller Inventory # 067402
Bibliographic details
- Title
- Physical Aspects of Electron Microscopy and Microbeam Analysis
- Author
- Siegel, Benjamin M.; Beaman, Donald R.
- Publisher
- John Wiley & Sons Ltd, U.S.A.
- Publication year
- 1975
- Condition
- Very Good
- Dust jacket
- Good
- Book Type
- Book
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0471790206
- ISBN 13
- 9780471790204
- Edition
- 1st Edition.
- Seller catalogs
- Science, Technical