Point Defects in Semiconductors II: Experimental Aspects: Volume 2 ( # 35 Springer Series in Solid-State Sciences)

Bourgoin, J. / M Lannoo

ISBN 10: 3540115153 ISBN 13: 9783540115151
Published by Springer Verlag Berlin, 1983
Language: English
Condition: Used - Very good Hardcover

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