Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits)

Language: English

Published by U.S.A.: John Wiley & Sons Ltd, 1981

0471280283 / 9780471280286

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  • Hardcover
  • Used
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Seller: Bingo Books 2, Vancouver, WA, U.S.A.Bingo Books 2

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Condition: Used - Very good

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hardback book and dust jacket in very good-plus condition,from private company library.

Seller Inventory # 129419

Title
Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits)
Author
Howes, M. J.; Morgan, David Vernon
Publisher
U.S.A.: John Wiley & Sons Ltd
Publication year
1981
Condition
Very Good
Dust jacket
Very Good
Binding
Hardcover
Language
English
ISBN 10
0471280283
ISBN 13
9780471280286
Edition
1st Edition
Seller catalogs
computer science, Science, technical

Bingo Books 2

Vancouver, WA, U.S.A.

4-star seller

AbeBooks seller since July 7, 2011

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Item5 to 15 business days3 to 7 business days
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