Hardcover. This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy. This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

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Bibliographic Details

Title: Scanning Auger Electron Microscopy (Hardcover)
Publisher: John Wiley & Sons Inc, New York
Publication Date: 2006
Language: English
ISBN 10: 0470866772
ISBN 13: 9780470866771
Binding: Hardcover
Edition: 1st Edition
Condition: new

About this title

Synopsis

This eagerly-awaited volume has been edited by two academic researchers with extensive and reputable experience in this field. Emphasis is given to the underlying science of the method of Auger microscopy, and its instrumental realization, the visualization and interpretation of the data in the sets of the images that form the output of the measurements and the methods used to quantify the images. Imaging artefacts in Auger microscopy and methods to correct them are also detailed. The authors describe the technique of Multi-Spectral Auger Microscopy (MULSAM) and demonstrate its advantages in mapping complex multi-component surfaces. The book concludes with an outlook for the future of Auger microscopy.

About the Author

Martin Prutton is the editor of Scanning Auger Electron Microscopy, published by Wiley.

Mohamed M. El Gomati is the editor of Scanning Auger Electron Microscopy, published by Wiley.

"About this title" may belong to another edition of this title.

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