Testing of Digital Systems

Jha, N. K.; Gupta, S.

ISBN 10: 0521773563 / ISBN 13: 9780521773560

Published by Cambridge University Press, 2003

About this Item

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Bibliographic Details

• Title: Testing of Digital Systems
• Publisher: Cambridge University Press
• Publication Date: 2003
• Language: English
• ISBN 10: 0521773563
• ISBN 13: 9780521773560
• Binding: Hardcover
• Edition: 1st Edition
• Condition: Very Good

About this title

Synopsis

Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

About the Authors

Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.