Transmission Electron Microscopy of Semiconductor Nanostructures : Analysis of Composition and Strain State
Language: English
Published by Springer, 2003
- First Edition
- Hardcover
- Used
Seller: Better World Books Ltd, Dunfermline, United KingdomBetter World Books Ltd
AbeBooks seller since October 13, 2008
Condition: Used - Very good
US$ 42.47
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Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Seller Inventory # 15513721-6
- Title
- Transmission Electron Microscopy of Semiconductor Nanostructures : Analysis of Composition and Strain State
- Author
- Rosenauer, Andreas
- Publisher
- Springer
- Publication year
- 2003
- Condition
- Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3540004149
- ISBN 13
- 9783540004141
- Edition
- 1st Edition.
- Item weight
- 1.323 pounds
- Dimensions
- N/A
- Series
- Book 85 of 227: Springer Tracts in Modern Physics
"Synopsis" may belong to another edition of this title.
From the Back Cover
This book provides tools well suited for the
quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor
nanostructures with a spatial resolution at near atomic scales. The book
focuses on new methods including strain state
analysis as well as evaluation of the composition
via the lattice fringe analysis (CELFA) technique.
The basics of these procedures as well as their
advantages, drawbacks and sources of error are all
discussed. The techniques are applied to quantum
wells and dots in order to give insight into
kinetic growth effects such as segregation and
migration.
In the first part of the book the fundamentals of
transmission electron microscopy are provided.
These are needed for an understanding of the
digital image analysis techniques described in the
second part of the book. There the reader will
find information on different methods of
composition determination. The third part of the
book focuses on applications such as composition
determination in InGaAs Stranski--Krastanov
quantum dots. Finally it is shown how an
improvement in the precision of the composition
evaluation can be obtained by combining CELFA with
electron holography. This is demonstrated for an
AlAs/GaAs superlattice.
"About the title" may belong to another edition of this title.
Better World Books Ltd
Dunfermline, United Kingdom
AbeBooks seller since October 13, 2008
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