Items related to Reliability and degradation: Semiconductor devices...
Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits) - Hardcover
Book by Howes, M. J., Morgan, David Vernon
"synopsis" may belong to another edition of this title.
- PublisherJ. Wiley
- Publication date1981
- ISBN 10 0471280283
- ISBN 13 9780471280286
- BindingHardcover
- Edition number1
- Number of pages444
Buy New
Learn more about this copy
US$ 53.40
Shipping:
US$ 4.00
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Stock Image
Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)
Seller:
Rating
Book Description Hardcover. Condition: new. New. Fast Shipping and good customer service. Seller Inventory # Holz_New_0471280283
Buy New
US$ 53.40
Convert currency
Stock Image
Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)
Seller:
Rating
Book Description Hardcover. Condition: new. New Copy. Customer Service Guaranteed. Seller Inventory # think0471280283
Buy New
US$ 53.32
Convert currency
Stock Image
Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)
Seller:
Rating
Book Description Hardcover. Condition: new. New. Seller Inventory # Wizard0471280283
Buy New
US$ 68.62
Convert currency
Stock Image
Reliability and degradation: Semiconductor devices and circuits (The Wiley series in solid state devices and circuits)
Seller:
Rating
Book Description Hardcover. Condition: new. Buy for Great customer experience. Seller Inventory # GoldenDragon0471280283
Buy New
US$ 71.13
Convert currency