Structural Analysis of Point Defects in Solids: An Introduction to Multiple Magnetic Resonance Spectroscopy: 43 (Springer Series in Solid-State Sciences) signed and inscribed by editor Ralph Bartram

Spaeth, Johann-Martin; Niklas, Jürgen R.; Bartram, Ralph H.

ISBN 10: 3540536159 / ISBN 13: 9783540536154

Published by Springer Verlag Berlin, 1992

About this Item

Published by Springer Verlag Berlin in 1992, here is the first hardback printing of Structural Analysis of Point Defects in Solids: An Introduction to multiple Magnetic Resonance Spectroscopy (Springer Series in Solid-State Sciences #43) edited by Ralph Bartram et el signed and inscribed by Ralph in blue ink to the eminent Theoretical Physicist Marshall Stoneham at the top of the front free end paper. Brown paper covered boards, 367 pages, illustrations plus further reading the book is in good condition with the sticker of former owner Professor Stoneham to the base of the front free end paper plus some moderate rubbing to the edges and corners of the boards.

Seller Inventory # 12564

Bibliographic Details

• Title: Structural Analysis of Point Defects in Solids: An Introduction to Multiple Magnetic Resonance Spectroscopy: 43 (Springer Series in Solid-State Sciences) signed and inscribed by editor Ralph Bartram
• Publisher: Springer Verlag Berlin
• Publication Date: 1992
• Language: English
• ISBN 10: 3540536159
• ISBN 13: 9783540536154
• Binding: Hardcover
• Edition: 1st Edition
• Condition: Good
• Signed: Signed by Author(s)

About this title

Synopsis

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.