Items related to Developments in Integrated Circuit Testing (Perspectives...
- PublisherAcademic Pr
- Publication date1987
- ISBN 10 0124967353
- ISBN 13 9780124967359
- BindingHardcover
- LanguageEnglish
- Number of pages440
- EditorMiller D. M.
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Developments in Integrated Circuit Testing
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. 440 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Seller Inventory # ZB615902
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Developments in Integrated Circuit Testing (Perspectives in Computing)
Published by
Academic Press Inc.,U.S., 1987
ISBN 10: 0124967353
ISBN 13: 9780124967359
Used
Hardcover
Seller: Ammareal, Morangis, France
Seller rating 5 out of 5 stars
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Traces de pliures sur la couverture. Traces d'usure sur la couverture. Couverture différente. Edition 1987. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Traces of creases on the cover. Signs of wear on the cover. Different cover. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-065-919
Quantity: 1 available