Surface and Interface Characterization by Electron Optical Methods (NATO Asi Series: Series B: Physics) - Hardcover

 
9780306430862: Surface and Interface Characterization by Electron Optical Methods (NATO Asi Series: Series B: Physics)

This specific ISBN edition is currently not available.

Synopsis

Proceedings held April 1987. Some topics considered include: transmission imaging of surfaces, fundamentals of high resolution transmission electron microscopy, surface microanalysis and microscopy by x-ray photoeletron spectroscopy, core-loss spectroscopy, and Auger electron spectroscopy, spin-polarized secondary electrons from ferromagnets, intensity oscillations in reflection high energy electron diffraction during epitaxial growth. Annotation copyright Book News, Inc. Portland, Or.

"synopsis" may belong to another edition of this title.

Other Popular Editions of the Same Title

9781461595397: Surface and Interface Characterization by Electron Optical Methods: (Closed)) (Nato ASI Subseries B:)

Featured Edition

ISBN 10:  1461595398 ISBN 13:  9781461595397
Publisher: Springer, 2012
Softcover