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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - Hardcover
Synopsis
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
"synopsis" may belong to another edition of this title.
Review
From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date1992
- ISBN 10 0306441756
- ISBN 13 9780306441752
- BindingHardcover
- LanguageEnglish
- Edition number2
- Number of pages840
- Rating
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Hardcover. Condition: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 4.38. Seller Inventory # G0306441756I3N01
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Condition: Acceptable. LIGHTNING FAST SHIPPING! A heavily used, but still working copy. Coffee stain and wrinkling to the edge of the pages when a tired undergrad fell asleep and knocked their cup over on their books. The binding and pages of the book have been reinforced with tape, has tape and stickers on the cover, as well as lots of notes (some of the answers in the learning activities may be filled in) on the pages. Definitely not pretty, but it's a working copy at a great price that ships fast. ~ Book does NOT contain an access code or CD/DVD. Seller Inventory # #212F-00072
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists (Second Edition)
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Condition: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine. Seller Inventory # 009504
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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Scanning Electron Microscopy and X-Ray Microanalysis: A Ts and Geoext for Biologists, Materials Scientistlogists
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Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust jacket in poor condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2000grams, ISBN:0306441756. Seller Inventory # 9797329
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. 2nd Edition
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Scanning Electron Microscopy and X-ray Microanalysis
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Kluwer Academic Publishers Group, 1992
ISBN 10: 0306441756
ISBN 13: 9780306441752
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Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. Innen: Seiten eingerissen. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 800 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 1273477/202
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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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