Items related to Scanning Electron Microscopy and X-Ray Microanalysis:...
Synopsis
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
"synopsis" may belong to another edition of this title.
About the Author
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
Review
“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005)
“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. 9 (5), October, 2003)
"About this title" may belong to another edition of this title.
- PublisherSpringer
- Publication date2003
- ISBN 10 0306472929
- ISBN 13 9780306472923
- BindingHardcover
- LanguageEnglish
- Edition number3
- Number of pages708
- Rating
Other Popular Editions of the Same Title
Search results for Scanning Electron Microscopy and X-Ray Microanalysis:...
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: HPB-Red, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_423620488
Quantity: 1 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: Goodwill Books, Hillsboro, OR, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Signs of wear and consistent use. Seller Inventory # 3IIT5G004T8G_ns
Quantity: 1 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages. Seller Inventory # 45936648-75
Quantity: 1 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: Chris Korczak, Bookseller, IOBA, Easthampton, MA, U.S.A.
Seller rating 5 out of 5 stars
hardcover. Condition: Very Good. Very mild shelfwear. We try to note every flaw we can find, and we are quite picky, so buy with confidence! 100% guaranteed! Seller Inventory # mon0000152920
Quantity: 1 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: Grumpys Fine Books, Tijeras, NM, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: very good. little wear and tear. Seller Inventory # Grumpy0306472929
Quantity: 1 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Seller: Grumpys Fine Books, Tijeras, NM, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: new. Prompt service guaranteed. Seller Inventory # Clean0306472929
Quantity: 1 available
Seller Image
Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer Nature Singapore Jan 2003, 2003
ISBN 10: 0306472929
ISBN 13: 9780306472923
New
Hardcover
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. 689 pp. Englisch. Seller Inventory # 9780306472923
Quantity: 2 available
Seller Image
Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and 'through-the-lens' detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping. Seller Inventory # 9780306472923
Quantity: 2 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis
Seller: Books Puddle, New York, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. pp. xix + 689 3rd Edition. Seller Inventory # 26282534
Quantity: 4 available
Stock Image
Scanning Electron Microscopy and X-Ray Microanalysis
Print on DemandSeller: Majestic Books, Hounslow, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Print on Demand pp. xix + 689 232 Illus. Seller Inventory # 7598201
Quantity: 4 available