Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the style of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.
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Chi-Lun Cheng is at Institute of State Science, Taiwan. John W. Van Ness is at University of Texas.Review:
"Overall, the presentation is inviting and the reader can expect to gain a good working knowledge of the subject without much tedious effort. The presentation is also kept simple by avoiding the useof tedious mathematical notation. The authors have succeeded well in their goal of "providing a comprehensive coverage of the subject that emphasizes the ideas and the practical implementation of the theory without too great an emphasis on the theorem-proof format." This book is on the top of my list for anyone interested in linear and polynomial measurement error models." -- Sudhir Gupta, Technometrics, Nov 2000, Vol 42, No 4
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Book Description Wiley, 1999. Hardcover. Book Condition: New. Never used!. Bookseller Inventory # P110340614617
Book Description Wiley. Hardcover. Book Condition: New. 0340614617 New Condition. Bookseller Inventory # NEW7.1036495
Book Description Wiley, 1999. Hardcover. Book Condition: New. 1. Bookseller Inventory # DADAX0340614617