Items related to Statistical Regression with Measurement Error (Kendall's...
Synopsis
This book explores measurement error models and discusses functional and structural models as well as the more general ultrastructural model. It offers an intermediate level survey of the field of measurement error models without too much mathematical detail, making the book accessible to a wide range of readers.
"synopsis" may belong to another edition of this title.
From the Back Cover
Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.
About the Author
Chi-Lun Cheng is at Institute of State Science, Taiwan. John W. Van Ness is at University of Texas.
"About this title" may belong to another edition of this title.
(No Available Copies)
Search Books: Create a WantCan't find the book you're looking for? We'll keep searching for you. If one of our booksellers adds it to AbeBooks, we'll let you know!
Create a Want
