Semiconductor Interfaces: Formation and Properties : Proceedings of the Workshop, Les Houches, France February 24-March 6, 1987 (Springer Proceedings in Physics) - Hardcover

G. Lelay; G. Le Lay

Hardcover

ISBN 10: 0387183280 ISBN 13: 9780387183282

Publisher: Springer Verlag, 1987

Synopsis

The trend towards miniaturization of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role upon semiconductor interfaces. Great advances have recently been made in the production of new thin-film materials and in the characterization of their interfacial properties down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures given by specialists at the International Winter School on "Semiconductor Interfaces: Formation and Properties", which was held at the Centre de Physique des Houches from 24 February to 6 March, 1987. The following topics are particularly emphasised: - Interface formation, including molecular beam epitaxy, the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. - Characterization down to the atomic scale using techniques such as STM, HRTEM, SEXAFS and SEELFS. - Specific physical properties of the interfaces and their prospective device applications.

Edition details

• Publisher: Springer Verlag
• Publication date: 1987
• ISBN 10: 0387183280
• ISBN 13: 9780387183282
• Binding: Hardcover
• Language: English
• Number of pages: 389