Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) - Hardcover
Synopsis
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
"synopsis" may belong to another edition of this title.
Review
"There is a definite need for documenting the advances in testing ... I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [...] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [...] This latest addition to the Frontiers Series is destined to serve an important role."
From the Foreword by Vishwani D. Agrawal, Consulting Editor
Frontiers in Electronic Testing Book Series
"About this title" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Advances in Electronic Testing: Challenges and Methodologies...
Stock Image
Advances In Electronic Testing Challenges And Methodologies
Seller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEOCT25-81955
Stock Image
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Seller: ALLBOOKS1, Direk, SA, Australia
Seller rating 5 out of 5 stars
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address. Seller Inventory # SHAK81955
Stock Image
Advances in Electronic Testing Challenges and Methodologies. 2007. Hardcover. xxi,412pp. Index. Series: Frontiers in Electronic Testing Vol. 27.
Seller: Antiquariaat Ovidius, Bredevoort, Netherlands
Seller rating 4 out of 5 stars
Condition: Gebraucht / Used. Fine state d582e. Seller Inventory # 74683
Buy Used
US$ 113.78
Shipping:
US$ 25.32
From Netherlands to U.S.A.
Quantity: 1 available
Stock Image
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Feb2215580171644
Seller Image
Advances in Electronic Testing
Published by
Springer US, Springer US Jan 2006, 2006
ISBN 10: 0387294082
ISBN 13: 9780387294087
New
Hardcover
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today s state-of-the-art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [ ]the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [ ]This latest addition to the Frontiers Series is destined to serve an important role.'From the Foreword by Vishwani D. Agrawal, Consulting EditorFrontiers in Electronic Testing Book Series 440 pp. Englisch. Seller Inventory # 9780387294087
Seller Image
Advances in Electronic Testing
Print on DemandSeller: moluna, Greven, Germany
Seller rating 4 out of 5 stars
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book that reviews a comprehensive set of advanced electronic testing topics Hot topics of current interest to test technology community has been selectedAuthors are key contributors in the corresponding topicsThe book has a pr. Seller Inventory # 5909800
Buy New
US$ 161.38
Shipping:
US$ 56.37
From Germany to U.S.A.
Quantity: Over 20 available
Stock Image
Advances in Electronic Testing : Challenges and Methodologies
Seller: Buchpark, Trebbin, Germany
Seller rating 5 out of 5 stars
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 2906638/12
Seller Image
Advances in Electronic Testing
Published by
Springer US, Springer US Jan 2006, 2006
ISBN 10: 0387294082
ISBN 13: 9780387294087
New
Hardcover
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today¿s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing ¿ I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [¿] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [¿] This latest addition to the Frontiers Series is destined to serve an important role.' From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 440 pp. Englisch. Seller Inventory # 9780387294087
Stock Image
Advances in Electronic Testing: Challenges And Methodologies
Seller: Revaluation Books, Exeter, United Kingdom
Seller rating 5 out of 5 stars
Hardcover. Condition: Brand New. 412 pages. 9.75x6.50x0.75 inches. In Stock. Seller Inventory # x-0387294082
Buy New
US$ 243.53
Shipping:
US$ 16.37
From United Kingdom to U.S.A.
Quantity: 2 available
Stock Image
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9780387294087_new
Buy New
US$ 248.37
Shipping:
US$ 15.69
From United Kingdom to U.S.A.
Quantity: Over 20 available