Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7) - Hardcover
Other Popular Editions of the Same Title
Search results for Computed electron micrographs and defect identification...
Stock Image
Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Seller: Ammareal, Morangis, France
Seller rating 5 out of 5 stars
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Edition 1973. Tome 7. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 1973. Volume 7. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-595-602
Buy Used
US$ 6.99
US$ 19.17 shipping
Ships from France to U.S.A.
Ships from France to U.S.A.
Quantity: 1 available
Stock Image
Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
hardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82904441046233
Buy Used
US$ 139.73
US$ 33.58 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available