Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2) - Hardcover
Book 4 of 241: NATO Science Series II: Mathematics, Physics and Chemistry
Synopsis
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Defects in SiO2 and Related Dielectrics: Science and...
Stock Image
Defects in Siob2s and Related Dielectrics : Science and Technology
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 756743-n
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Print on DemandSeller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-ox. Seller Inventory # 5969607
Buy New
US$ 215.33
US$ 56.88 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Stock Image
Defects in Siob2s and Related Dielectrics : Science and Technology
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 756743
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9780792366850_new
Buy New
US$ 261.40
US$ 16.08 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands Dez 2000, 2000
ISBN 10: 0792366859
ISBN 13: 9780792366850
New
Hardcover
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. 636 pp. Englisch. Seller Inventory # 9780792366850
Buy New
US$ 255.90
US$ 26.70 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: 2 available
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Dordrecht / Boston / London. Kluwer Academic Publishers. 2000., 2000
ISBN 10: 0792366859
ISBN 13: 9780792366850
Used
Softcover
Seller: Antiquariat am Flughafen, Berlin, Germany
Seller rating 5 out of 5 stars
Softcover. Hardcover 624 pages. with Figures and tables. In good clean, solid condition. Nato Science Series II. Mathematics, Physics and Chemistry Vol. 2. Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000. in englischer Sprache (in english). Seller Inventory # P5-0030
Buy Used
US$ 179.37
US$ 121.91 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: 1 available
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Print on DemandSeller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Defects in SiO2 and Related Dielectrics: Science and Technology | Gianfranco Pacchioni (u. a.) | Buch | NATO Science Series II: Mathematics, Physics and Chemistry | viii | Englisch | 2000 | Springer Netherland | EAN 9780792366850 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 102549877
Buy New
US$ 223.26
US$ 81.27 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: 5 available
Stock Image
Defects in SiO2 and Related Dielectrics
Published by
Kluwer Academic Publishers, 2000
ISBN 10: 0792366859
ISBN 13: 9780792366850
New
Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 Editor(s): Pacchioni, G.; Skuja, Linards; Griscom, David L. Series: NATO Science Series II. Num Pages: 624 pages, 87 black & white illustrations, biography. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 34. Weight in Grams: 1061. . 2000. Hardback. . . . . Seller Inventory # V9780792366850
Buy New
US$ 305.40
US$ 12.19 shipping
Ships from Ireland to U.S.A.
Ships from Ireland to U.S.A.
Quantity: 15 available
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands, Springer Netherlands Dez 2000, 2000
ISBN 10: 0792366859
ISBN 13: 9780792366850
New
Hardcover
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 636 pp. Englisch. Seller Inventory # 9780792366850
Buy New
US$ 255.90
US$ 69.66 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: 1 available
Stock Image
Defects in SiO2 and Related Dielectrics
Seller: Books Puddle, New York, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. pp. 636. Seller Inventory # 263093536