Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73) - Hardcover
Synopsis
Book by Kwang-Ting (Tim) Cheng, Agrawal, Vishwani D.
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation:
Published by
Boston. Kluwer Academic, 1989
ISBN 10: 0792390253
ISBN 13: 9780792390251
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation
Published by
Kluwer Academic Publishers, 1989
ISBN 10: 0792390253
ISBN 13: 9780792390251
New
Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Condition: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 148 pages, biography. BIC Classification: TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 410. . 1989. Hardback. . . . . Seller Inventory # V9780792390251