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Book by Beddow, John Keith
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Particle Characterization in Technology: Volume II: Morphological Analysis
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
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Condition: Very Good. 265 pp., hardcover, minor library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Seller Inventory # ZB1221441
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Particle Characterization in Technology, Vol. 2: Morphological Analysis
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Particle Characterization in Technology, Vol. 2: Morphological Analysis
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
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Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions. Seller Inventory # Z1-N-008-00552
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