Electron Microscopy and Analysis (Second Edition) - Softcover

Goodhew, Peter J.; Humphreys, F. J.

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9780850664140: Electron Microscopy and Analysis (Second Edition)

Synopsis

This is a comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline and non-crystalline materials.

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About the Author

Peter J. Goodhew is a materials scientist who has worked with Electron Microscopes for 35 years at the University of Surrey, Cornell University and The University of Liverpool. He has written more than 200 papers on the applications of Electron Microscopes in metallurgy and semiconductor science. He is currently the Henry Bell Wortley, Professor of Materials Engineering at The University of Liverpool

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