Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29) - Hardcover
Synopsis
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
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About the Author
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
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Introduction to Advanced System-on-Chip Test Design and Optimization.
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gebundene Ausgabe. Condition: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860. Seller Inventory # 1593690
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INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TEST DESIGN AND OPTIMIZATION
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ISBN 10: 1402032072
ISBN 13: 9781402032073
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Hardcover. Condition: Near Fine. Dust Jacket Condition: No Dust Jacket. 1st. (NETH) Presumed 1st edition Ownership stamp to top edge of pages, small ownerhsip label to the back of the cover, no other markings, Near Fine; no dust jacket as published. Hardcover, 388pp, index, diagrams. This book gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. (2.5 JM 0322 Size: 8vo - over 7¾" - 9¾". Seller Inventory # 07175
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Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
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Introduction to Advanced System-on-Chip Test Design and Optimization
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. 408 pp. Englisch. Seller Inventory # 9781402032073
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Introduction to Advanced System-on-Chip Test Design and Optimization
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System perspective to SOC test design. Overview of test problems and their modelingTest scheduling overview, extensive reference list Applicable for Master students and PhD-students working in the test field. Could also be good for research. Seller Inventory # 4093246
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Introduction to Advanced System-on-Chip Test Design and Optimization
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Buch. Condition: Neu. Introduction to Advanced System-on-Chip Test Design and Optimization | Erik Larsson | Buch | xx | Englisch | 2005 | Copernicus | EAN 9781402032073 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 102371840
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Introduction to Advanced System-on-Chip Test Design and Optimization
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ISBN 10: 1402032072
ISBN 13: 9781402032073
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Buch. Condition: Neu. Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 408 pp. Englisch. Seller Inventory # 9781402032073
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Introduction to Advanced System-on-Chip Test Design and Optimization
Published by
Springer US, Springer US, 2005
ISBN 10: 1402032072
ISBN 13: 9781402032073
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Seller Inventory # 9781402032073
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Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)
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