Items related to Thermal Testing of Integrated Circuits
Synopsis
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
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Thermal Testing Of Integrated Circuits
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Thermal Testing Of Integrated Circuits
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Thermal testing of integrated circuits.
Published by
Boston, Mass., Kluwer Acad. Publ, 2002
ISBN 10: 1402070764
ISBN 13: 9781402070761
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Hardcover. Condition: Gut. 204 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 9781402070761 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2149702
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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits
Print on DemandSeller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art. 220 pp. Englisch. Seller Inventory # 9781402070761
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Thermal Testing of Integrated Circuits
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Condition: New. In English. Seller Inventory # ria9781402070761_new
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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits
Published by
Kluwer Academic Publishers, 2002
ISBN 10: 1402070764
ISBN 13: 9781402070761
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Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Condition: New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. This title presents the feasibility to consider temperature as an observable for testing purposes. Num Pages: 204 pages, 102 black & white illustrations, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 240 x 160 x 14. Weight in Grams: 547. . 2002. Hardback. . . . . Seller Inventory # V9781402070761
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Thermal Testing of Integrated Circuits
Print on DemandSeller: moluna, Greven, Germany
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state. Seller Inventory # 4094823
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