Examining the Submicron World - Softcover

Feder, Ralph; McGowan, J. Wm.; Shinozaki, Douglas M.

 
9781461322108: Examining the Submicron World

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Synopsis

Scanning Tunneling Microscopy.- Applications and Limitations of Sims.- Analytical Ion Microscopy of Cells and Tissues.- Electron Spectroscopies for Studying Chemical Bondings at Surfaces.- High Resolution Electron Microscopy in Materials Science.- Electron Microscopy in Real Colours.- Scattered Electrons in Biological Structure Determination.- An Improved Method for High Contrast Phase Electron Microscopy.- Energy Deposition by X-Rays and Electrons.- Synchrotron Radiation and the Submicron World: Selected Activities at the Daresbury Laboratory, U.K..- Properties of Polymer Resists.- Fabrication of Very Small Structures.- Lenses for Soft X-Rays and X-ray Microscopy Experiments.- Scanning Soft X-Ray Microscopy at the Brookhaven Light Source.- Development of a Scanning X-Ray Microscope at the Daresbury Laboratory.- X-Ray Contact Microscopy.- Ultra Soft X-Ray Contact Microscopy: A New Tool for Plant and Animal Cytology.- Soft X-Ray Microscopy of Activated Human Platelets.

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Other Popular Editions of the Same Title

9780306422782: Examining the Submicron World (Nato ASI Subseries B:, 137)

Featured Edition

ISBN 10:  0306422786 ISBN 13:  9780306422782
Publisher: Springer, 1986
Hardcover