Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

4.34 avg rating
( 35 ratings by Goodreads )
 
9781461332756: Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
View all copies of this ISBN edition:
 
 

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter­ actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru­ ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

"synopsis" may belong to another edition of this title.

Buy New View Book
List Price: US$ 149.99
US$ 90.59

Convert currency

Shipping: US$ 4.93
From United Kingdom to U.S.A.

Destination, rates & speeds

Add to Basket

Top Search Results from the AbeBooks Marketplace

1.

Goldstein, Joseph
Published by Springer (2016)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Paperback Quantity Available: 1
Print on Demand
Seller:
Ria Christie Collections
(Uxbridge, United Kingdom)
Rating
[?]

Book Description Springer, 2016. Paperback. Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461332756_lsuk

More information about this seller | Contact this seller

Buy New
US$ 90.59
Convert currency

Add to Basket

Shipping: US$ 4.93
From United Kingdom to U.S.A.
Destination, rates & speeds

2.

Joseph Goldstein, Dale E. Newbury, Patrick Echlin,
Published by Springer-Verlag New York Inc., United States (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Paperback Quantity Available: 10
Seller:
Book Depository hard to find
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2013. Paperback. Condition: New. 1981 ed.. Language: English. Brand new Book. This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter- actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru- ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail. Seller Inventory # LIE9781461332756

More information about this seller | Contact this seller

Buy New
US$ 130.57
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

3.

Joseph Goldstein
Published by Springer (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Quantity Available: > 20
Print on Demand
Seller:
Paperbackshop-US
(Wood Dale, IL, U.S.A.)
Rating
[?]

Book Description Springer, 2013. PAP. Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781461332756

More information about this seller | Contact this seller

Buy New
US$ 135.39
Convert currency

Add to Basket

Shipping: US$ 3.99
Within U.S.A.
Destination, rates & speeds

4.

Joseph Goldstein, Dale E. Newbury, Patrick Echlin,
Published by Springer-Verlag New York Inc., United States (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Paperback Quantity Available: 10
Seller:
Book Depository International
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2013. Paperback. Condition: New. 1981 ed.. Language: English. Brand new Book. This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter- actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru- ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail. Seller Inventory # AAV9781461332756

More information about this seller | Contact this seller

Buy New
US$ 140.52
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

5.

Joseph Goldstein, Dale E. Newbury, Patrick Echlin
Published by Springer-Verlag New York Inc., United States (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Paperback Quantity Available: 10
Print on Demand
Seller:
The Book Depository
(London, United Kingdom)
Rating
[?]

Book Description Springer-Verlag New York Inc., United States, 2013. Paperback. Condition: New. 1981 ed.. Language: English . Brand New Book ***** Print on Demand *****.This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter- actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru- ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail. Seller Inventory # AAV9781461332756

More information about this seller | Contact this seller

Buy New
US$ 144.67
Convert currency

Add to Basket

Shipping: FREE
From United Kingdom to U.S.A.
Destination, rates & speeds

6.

Joseph Goldstein
Published by Springer (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Quantity Available: > 20
Print on Demand
Seller:
Books2Anywhere
(Fairford, GLOS, United Kingdom)
Rating
[?]

Book Description Springer, 2013. PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781461332756

More information about this seller | Contact this seller

Buy New
US$ 140.54
Convert currency

Add to Basket

Shipping: US$ 11.46
From United Kingdom to U.S.A.
Destination, rates & speeds

7.

Joseph Goldstein; Dale E. Newbury; Patrick Echlin
Published by Springer (2014)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Softcover Quantity Available: 15
Print on Demand
Seller:
Rating
[?]

Book Description Springer, 2014. Condition: New. This item is printed on demand for shipment within 3 working days. Seller Inventory # LP9781461332756

More information about this seller | Contact this seller

Buy New
US$ 164.50
Convert currency

Add to Basket

Shipping: US$ 4.32
From Germany to U.S.A.
Destination, rates & speeds

8.

Goldstein, Joseph; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Fiori, Charles; Lifshin, Eric
Published by Springer
ISBN 10: 1461332753 ISBN 13: 9781461332756
New PAPERBACK Quantity Available: > 20
Seller:
Russell Books
(Victoria, BC, Canada)
Rating
[?]

Book Description Springer. PAPERBACK. Condition: New. 1461332753 Special order direct from the distributor. Seller Inventory # ING9781461332756

More information about this seller | Contact this seller

Buy New
US$ 202.49
Convert currency

Add to Basket

Shipping: US$ 7.00
From Canada to U.S.A.
Destination, rates & speeds

9.

Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
Published by Springer (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Softcover Quantity Available: 1
Seller:
Irish Booksellers
(Portland, ME, U.S.A.)
Rating
[?]

Book Description Springer, 2013. Condition: New. book. Seller Inventory # M1461332753

More information about this seller | Contact this seller

Buy New
US$ 209.64
Convert currency

Add to Basket

Shipping: US$ 3.27
Within U.S.A.
Destination, rates & speeds

10.

Joseph Goldstein
Published by Springer (2013)
ISBN 10: 1461332753 ISBN 13: 9781461332756
New Paperback Quantity Available: 2
Seller:
Revaluation Books
(Exeter, United Kingdom)
Rating
[?]

Book Description Springer, 2013. Paperback. Condition: Brand New. 673 pages. 8.00x5.00x2.00 inches. In Stock. Seller Inventory # x-1461332753

More information about this seller | Contact this seller

Buy New
US$ 205.12
Convert currency

Add to Basket

Shipping: US$ 9.55
From United Kingdom to U.S.A.
Destination, rates & speeds

There are more copies of this book

View all search results for this book