Quantitative X-Ray Diffractometry

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9781461395379: Quantitative X-Ray Diffractometry
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One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.

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Lev S. Zevin, Giora Kimmel
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Book Description Springer-Verlag New York Inc., United States, 2011. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers. Softcover reprint of the original 1st ed. 1995. Seller Inventory # AAV9781461395379

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Book Description Springer-Verlag New York Inc., 2011. PAP. Condition: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781461395379

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Lev S. Zevin, Giora Kimmel
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Book Description Springer-Verlag New York Inc., United States, 2011. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****.One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers. Softcover reprint of the original 1st ed. 1995. Seller Inventory # AAV9781461395379

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Book Description Springer, 2016. Paperback. Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461395379_lsuk

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Book Description Springer, 2011. Paperback. Condition: NEW. 9781461395379 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. For all enquiries, please contact Herb Tandree Philosophy Books directly - customer service is our primary goal. Seller Inventory # HTANDREE0303409

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Book Description Springer-Verlag New York Inc., 2011. PAP. Condition: New. New Book. Delivered from our UK warehouse in 3 to 5 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # LQ-9781461395379

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Lev S. Zevin, Giora Kimmel
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Book Description Springer-Verlag New York Inc., United States, 2011. Paperback. Condition: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers. Softcover reprint of the original 1st ed. 1995. Seller Inventory # LIE9781461395379

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Zevin, Lev S.; Kimmel, Giora; Mureinik, Inez [Editor]
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Book Description Springer, 2011. Paperback. Condition: New. Seller Inventory # INGM9781461395379

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Book Description Springer. Paperback. Condition: New. 372 pages. Dimensions: 9.6in. x 6.6in. x 0.9in.One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Seller Inventory # 9781461395379

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Lev S. Zevin; Giora Kimmel
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Book Description Springer, 1995. Condition: New. This item is printed on demand for shipment within 3 working days. Seller Inventory # LP9781461395379

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