Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - Softcover

Ruijing Shen; Sheldon X.-D. Tan; Hao Yu

 
9781461407898: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

This specific ISBN edition is currently not available.

Synopsis

This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications in real circuit design.

"synopsis" may belong to another edition of this title.

Other Popular Editions of the Same Title