Items related to Testability Concepts for Digital ICs: The Macro Test...
Synopsis
Preface. 1. Introduction. 2. Defect-Oriented Testing. 3. Macro Test: A Framework for Testable IC Design. 4. Examples of Leaf-Macro Test Techniques. 5. Scan Chain Routing with Minimal Test Application Time. 6. Test Control Block Concepts. 7. Exploiting Parallelism in Leaf-Macro Access. 8. Timing Aspects of CMOS VLSI Circuits. List of Symbols and Abbreviations. References. Index.
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- PublisherSpringer
- Publication date2011
- ISBN 10 1461523664
- ISBN 13 9781461523666
- BindingPaperback
- LanguageEnglish
- Number of pages228
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