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Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing, 27) - Softcover
Synopsis
This new volume in the Frontiers in Electronic Testing book series is devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state-of-the-art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. The book is intended for advanced undergraduate and graduate students, and professionals in the electronic testing realm.
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Review
"There is a definite need for documenting the advances in testing ... I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [...] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [...] This latest addition to the Frontiers Series is destined to serve an important role."
From the Foreword by Vishwani D. Agrawal, Consulting Editor
Frontiers in Electronic Testing Book Series
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Advances in Electronic Testing (Paperback)
Published by
Springer-Verlag New York Inc., New York, 2014
ISBN 10: 1489987738
ISBN 13: 9781489987730
New
Paperback
Seller: Grand Eagle Retail, Mason, OH, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records todays state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects."There is a definite need for documenting the advances in testing I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series. This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781489987730
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Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing, 27)
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Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing, 27)
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Advances in Electronic Testing
Print on DemandSeller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. 'Hot' topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics. 440 pp. Englisch. Seller Inventory # 9781489987730
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Advances in Electronic Testing
Print on DemandSeller: moluna, Greven, Germany
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book that reviews a comprehensive set of advanced electronic testing topics Hot topics of current interest to test technology community has been selectedAuthors are key contributors in the corresponding topicsThe book has a pr. Seller Inventory # 11466806
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Advances in Electronic Testing
Published by
Springer US, Springer New York Dez 2014, 2014
ISBN 10: 1489987738
ISBN 13: 9781489987730
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Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today¿s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing ¿ I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [¿] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [¿] This latest addition to the Frontiers Series is destined to serve an important role.' From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 440 pp. Englisch. Seller Inventory # 9781489987730
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Advances in Electronic Testing : Challenges and Methodologies
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today's state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing . I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [.] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [.] This latest addition to the Frontiers Series is destined to serve an important role.' From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series. Seller Inventory # 9781489987730
Quantity: 1 available
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Advances in Electronic Testing (Paperback)
Published by
Springer-Verlag New York Inc., New York, 2014
ISBN 10: 1489987738
ISBN 13: 9781489987730
New
Paperback
Seller: AussieBookSeller, Truganina, VIC, Australia
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records todays state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects."There is a definite need for documenting the advances in testing I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series. This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Seller Inventory # 9781489987730
Quantity: 1 available