Si Detectors and Characterization for HEP and Photon Science Experiment: How to Design Detectors by TCAD Simulation - Softcover

Srivastava, Ajay Kumar

Softcover

ISBN 10: 3030195333 ISBN 13: 9783030195335

Publisher: Springer, 2020

Synopsis

This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD  simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.

Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.

The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL.

About this title

About the Author

Ajay Srivastava received his Ph.D. degree in Experimental High Energy Physics “Development of Si strip detector for the ECAL of the CMS Experiment at CERN, Geneva” at the Department of Physics, University of Delhi and Helsinki Institute of Physics, University of Helsinki, Finland. Thereafter, he worked as a Postdoctoral fellow at the Institute for Experimental Physics, University of Hamburg on two prestigious projects in Germany DESY with Professor Dr. Robert Klanner at DESY; “short strip p+n detector for inner tracking of CMS tracker upgrade”  and “ x-ray p+n pixel detector for the European XFEL”. He was a visiting scientist at CERN, Geneva from (2008―2010). He then did a second postdoctoral work “development of DSSD for Belle2” at the Tata Institute of Fundamental Research (TIFR), Mumbai with Prof. Tariq Aziz. In 2012, he worked as a Senior Scientist at FEI Company (now Thermo Fisher Scientific Instruments), USA. 

Ajay is currently a full Professor (Physics) at Chandigarh University involved in the research & development of p+n strip detectors for the phase-2 upgrade of the CMS tracker upgrade for the HL-LHC (2026) and x ray p+n pixel detector for the next generation photon science experiments. He has received several awards, fellowships and honors, such as a CIMO Fellow, UGC, New Delhi, DST (RA, Scientist), Govt. India, Industrial Resident, IMEC, Belgium, DAE RA-3 Honorarium, TIFR, Mumbai, just to mention a few. 

His research is published in more than 73 international peer reviewed research Journals. He is a referee  international journals and an editorial member of Medcrave, USA (OAJNP) & worked in the International European Experiments (CMS CERN, CEC CMS) & CERN RD50 Collaborations.

 

From the Back Cover

This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.

Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.

The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiationenvironment of the colliders and at XFEL.

 

Edition details

• Publisher: Springer
• Publication date: 2020
• Language: English
• ISBN 10: 3030195333
• ISBN 13: 9783030195335
• Binding: Paperback
• Edition number: 1
• Number of pages: 204