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- PublisherSpringer
- Publication date2021
- ISBN 10 3030415384
- ISBN 13 9783030415389
- BindingPaperback
- LanguageEnglish
- Edition number1
- Number of pages264
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Springer International Publishing, 2021
ISBN 10: 3030415384
ISBN 13: 9783030415389
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Condition: Hervorragend. Zustand: Hervorragend | Seiten: 264 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 37289672/1
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Springer International Publishing Mrz 2021, 2021
ISBN 10: 3030415384
ISBN 13: 9783030415389
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization. 264 pp. Englisch. Seller Inventory # 9783030415389
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Published by
Springer International Publishing, 2021
ISBN 10: 3030415384
ISBN 13: 9783030415389
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization. Seller Inventory # 9783030415389
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies 1st ed. 2020 Edition
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies 1st ed. 2020 Edition
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