Items related to Soft Error Reliability of VLSI Circuits: Analysis and...
- PublisherSpringer
- Publication date2021
- ISBN 10 3030516121
- ISBN 13 9783030516123
- BindingPaperback
- LanguageEnglish
- Edition number1
- Number of pages128
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
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Soft Error Reliability of VLSI Circuits
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Springer International Publishing Okt 2021, 2021
ISBN 10: 3030516121
ISBN 13: 9783030516123
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Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. 128 pp. Englisch. Seller Inventory # 9783030516123
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Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques
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Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques
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Springer International Publishing, Springer International Publishing, 2021
ISBN 10: 3030516121
ISBN 13: 9783030516123
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Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Seller Inventory # 9783030516123
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Soft Error Reliability of VLSI Circuits
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Springer, Berlin|Springer International Publishing|Springer, 2021
ISBN 10: 3030516121
ISBN 13: 9783030516123
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniqu. Seller Inventory # 510444609
Quantity: Over 20 available