Interconnect Reliability in Advanced Memory Device Packaging - Softcover

Book 86 of 90: Springer Series in Reliability Engineering

Gan, Chong Leong; Huang, Chen-Yu

 
9783031267093: Interconnect Reliability in Advanced Memory Device Packaging
Softcover
ISBN 10: 3031267095 ISBN 13: 9783031267093
Publisher: Springer, 2023

Synopsis

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.

In the past 40 years, memory packaging processes have evolved enormously. This book discusses the reliability and technical challenges of first-level interconnect materials, packaging processes, advanced specialty reliability testing, and characterization of interconnects. It also examines the reliability of wire bonding, lead-free solder joints such as reliability testing and data analyses, design for reliability in hybrid packaging and HBM packaging, and failure analyses. The specialty of this book is that the materials covered are not only for second-level interconnects, but also for packaging assembly on first-level interconnects and for the semiconductor back-end on 2.5D and 3D memory interconnects.

This book can be used as a text for college and graduate students who have the potential to become our future leaders, scientists, and engineers in the electronics and semiconductor industry.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2023
Language
English
ISBN 10 
3031267095
ISBN 13 
9783031267093
Binding
Paperback
Number of pages
230

Other Popular Editions of the Same Title

9783031267079: Interconnect Reliability in Advanced Memory Device Packaging (Springer Series in Reliability Engineering)

Featured Edition

ISBN 10:  3031267079 ISBN 13:  9783031267079
Publisher: Springer, 2023
Hardcover