This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.
The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics.
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Dr. Zhong Lin Wang is a preeminent physicist and materials scientist whose groundbreaking work has revolutionized the fields of nanotechnology, energy harvesting, and self-powered systems. He currently serves as the director of the Beijing Institute of Nanoenergy and Nanosystems and holds the distinguished titles of Regents' Professor and Hightower Chair (Emeritus) at the Georgia Institute of Technology. Dr. Wang is widely recognized as the pioneer of the nanogenerators field, which has enabled advancements in distributed energy, self-powered sensors, and large-scale blue energy. Additionally, he coined and developed the fields of piezotronics and piezo-phototronics, which have significant implications for third-generation semiconductors. Wang has also made outstanding contribution to fundamentals of electron microscopy. Dr. Wang’s scientific impact is unparalleled.
This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.
The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics. 495 pp. Englisch. Seller Inventory # 9783031908187
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Buch. Condition: Neu. Elastic and Inelastic Scattering in Electron Diffraction and Imaging | Zhong Lin Wang | Buch | Springer Series in Solid-State Sciences | xxv | Englisch | 2025 | Springer | EAN 9783031908187 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 134288963
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 528 pp. Englisch. Seller Inventory # 9783031908187
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth exploration of the physics underlying electron diffraction and imaging, with a focus on their applications in materials characterization. Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images. Since then, significant progress has been made in the field, necessitating this revised second edition.The second edition introduces new content, particularly emphasizing the diffraction and imaging of inelastically scattered electrons, a topic that has not been extensively covered in existing literature. This edition also includes updated theories and methodologies, reflecting the advancements in the field over the past decades. The book assumes that readers have a foundational understanding of electron microscopy, electron diffraction, and quantum mechanics. It aims to serve as a comprehensive guide for approaching phenomena observed in electron microscopy from the perspective of diffraction physics. Seller Inventory # 9783031908187
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